Zhang, Taizhi : rechercher sur Z-Library

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1

Power loss analysis of active clamp forward converter in continuous conduction mode and discontinuous conduction mode operating modes

Xu, Shen, Zhang, Taizhi, Yao, Yunpeng, Sun, Weifeng

Journal:

IET Power Electronics

Année:

2013

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2013

2

[IEEE 2014 IEEE Energy Conversion Congress and Exposition (ECCE) - Pittsburgh, PA, USA (2014.9.14-2014.9.18)] 2014 IEEE Energy Conversion Congress and Exposition (ECCE) - Analysis on ringing effect of auxiliary winding in primary side regulated flyback converter

Zhang, Taizhi, Qian, Qinsong, Xu, Manchao, Sun, Weifeng, Lu, Shengli

Année:

2014

Langue:

english

Fichier:

PDF, 1.00 MB

english, 2014

3

An electrolytic capacitor-less LED driver with interleaving flyback topology

Zhang, Taizhi, Qian, Qinsong, Xu, Shen, Lu, Shengli, Sun, Weifeng

Journal:

International Journal of Circuit Theory and Applications

Année:

2015

Langue:

english

Fichier:

PDF, 2.38 MB

english, 2015

4

Oscillation effect of auxiliary winding in primary side regulated flyback converter

Zhang, Taizhi, Xu, Manchao, Qian, Qinsong, Sun, Weifeng, Lu, Shengli

Journal:

IEEJ Transactions on Electrical and Electronic Engineering

Année:

2016

Langue:

english

Fichier:

PDF, 1.22 MB

english, 2016

5

Impact of stray inductances of the power loop on false trigger-on in the zero-voltage-switching full-bridge converter

Qian, Qinsong, Zhang, Taizhi, Sun, Weifeng, Lu, Shengli

Journal:

International Journal of Circuit Theory and Applications

Année:

2017

Langue:

english

Fichier:

PDF, 1.22 MB

english, 2017

6

[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Année:

2018

Langue:

english

Fichier:

PDF, 741 KB

english, 2018

7

[IEEE 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Otranto, Italy (2019.6.13-2019.6.14)] 2019 IEEE 8th International Workshop on Advances in Sensors and Interfaces (IWASI) - Impact of Front-End Wearout Mechanisms on the Performance of a Ring Oscillator-Based Thermal Sensor

Zhang, Rui, Yang, Kexin, Liu, Taizhi, Milor, Linda

Année:

2019

Langue:

english

Fichier:

PDF, 1.37 MB

english, 2019

8

SRAM Stability Analysis and PerformanceâReliability Tradeoff for Different Cache Configurations

Zhang, Rui, Liu, Taizhi, Yang, Kexin, Chen, Chang-Chih, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Année:

2020

Fichier:

PDF, 2.33 MB

2020

9

[IEEE 2020 IEEE International Reliability Physics Symposium (IRPS) - Dallas, TX, USA (2020.4.28-2020.5.30)] 2020 IEEE International Reliability Physics Symposium (IRPS) - Inverse Design of FinFET SRAM Cells

Zhang, Rui, Liu, Zhaocheng, Yang, Kexin, Liu, Taizhi, Cai, Wenshan, Milor, Linda

Année:

2020

Fichier:

PDF, 799 KB

2020

10

[ACM Press the 8th ACM European Conference - Prague, Czech Republic (2013.04.15-2013.04.17)] Proceedings of the 8th ACM European Conference on Computer Systems - EuroSys '13 - TimeStream

Qian, Zhengping, He, Yong, Su, Chunzhi, Wu, Zhuojie, Zhu, Hongyu, Zhang, Taizhi, Zhou, Lidong, Yu, Yuan, Zhang, Zheng

Année:

2013

Langue:

english

Fichier:

PDF, 702 KB

english, 2013

11

Understanding the Flash Sintering of Rare-Earth-Doped Ceria for Solid Oxide Fuel Cell

Jiang, Taizhi, Wang, Zhenhua, Zhang, Jing, Hao, Xiaoming, Rooney, David, Liu, Yajie, Sun, Wang, Qiao, Jinshuo, Sun, Kening, Hay, R.

Journal:

Journal of the American Ceramic Society

Année:

2015

Langue:

english

Fichier:

PDF, 1.18 MB

english, 2015

12

Flash-Sintering and Characterization of La0.8Sr0.2Ga0.8Mg0.2O3-δ Electrolytes for Solid Oxide Fuel Cells

Sun, Kening, Zhang, Jing, Jiang, Taizhi, Qiao, Jinshuo, Sun, Wang, Rooney, David, Wang, Zhenhua

Journal:

Electrochimica Acta

Année:

2016

Langue:

english

Fichier:

PDF, 2.24 MB

english, 2016

13

Magnetic flux density bias analysis and suppression strategy for voltage-fed single-stage full-bridge converter

Zhang, Taizhi, Lu, Zhipeng, Qian, Qinsong, Sun, Weifeng, Lu, Shengli

Journal:

International Journal of Circuit Theory and Applications

Année:

2016

Langue:

english

Fichier:

PDF, 2.82 MB

english, 2016

14

Inspired by the “tip effect”: a novel structural design strategy for the cathode in advanced lithium–sulfur batteries

Yang, Yuxiang, Wang, Zhenhua, Li, Guangdong, Jiang, Taizhi, Tong, Yujin, Yue, Xinyang, Zhang, Jing, Mao, Zhu, Sun, Wang, Sun, Kening

Journal:

Journal of Materials Chemistry A

Année:

2017

Langue:

english

Fichier:

PDF, 1.74 MB

english, 2017

15

Densification of 8 mol% yttria-stabilized zirconia at low temperature by flash sintering technique for solid oxide fuel cells

Zhang, Jing, Wang, Zhenhua, Jiang, Taizhi, Xie, Liqiang, Sui, Chao, Ren, Rongzheng, Qiao, Jinshuo, Sun, Kening

Journal:

Ceramics International

Année:

2017

Langue:

english

Fichier:

PDF, 1.07 MB

english, 2017

16

[IEEE 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Barcelona, Spain (2017.11.22-2017.11.24)] 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Modeling for SRAM reliability degradation due to gate oxide breakdown with a compact current model

Zhang, Rui, Liu, Taizhi, Yang, Kexin, Milor, Linda

Année:

2017

Langue:

english

Fichier:

PDF, 414 KB

english, 2017

17

[IEEE 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - Barcelona, Spain (2017.11.22-2017.11.24)] 2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS) - A comparison study of time-dependent dielectric breakdown for analog and digital circuit's optimal accelerated test regions

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Année:

2017

Langue:

english

Fichier:

PDF, 584 KB

english, 2017

18

Tunable Resonance Coupling in Single Si Nanoparticle-Monolayer WS2 Structures

Lepeshov, Sergey, Wang, Mingsong, Krasnok, Alex, Kotov, Oleg, Zhang, Tianyi, Liu, He, Jiang, Taizhi, Korgel, Brian A., Terrones, Mauricio, Zheng, Yuebing, Alu, Andrea

Journal:

ACS Applied Materials & Interfaces

Année:

2018

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2018

19

[IEEE 2017 IEEE International Integrated Reliability Workshop (IIRW) - Fallen Leaf Lake, CA (2017.10.8-2017.10.12)] 2017 IEEE International Integrated Reliability Workshop (IIRW) - Modeling of the reliability degradation of a FinFET-based SRAM due to bias temperature instability, hot carrier injection, and gate oxide breakdown

Zhang, Rui, Liu, Taizhi, Yang, Kexin, Milor, Linda

Année:

2017

Langue:

english

Fichier:

PDF, 878 KB

english, 2017

20

[IEEE 2017 IEEE International Integrated Reliability Workshop (IIRW) - Fallen Leaf Lake, CA (2017.10.8-2017.10.12)] 2017 IEEE International Integrated Reliability Workshop (IIRW) - A lifetime and power sensitive design optimization framework for a radio frequency circuit

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Année:

2017

Langue:

english

Fichier:

PDF, 770 KB

english, 2017

21

Synthesis and Characterization of Process-Related Impurities of Antidiabetic Drug Linagliptin

Huang, Yiwen, He, Xiaoqing, Wu, Taizhi, Zhang, Fuli

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 1.88 MB

english, 2016

22

A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Année:

2018

Fichier:

PDF, 4.98 MB

2018

23

A Comprehensive Time-Dependent Dielectric Breakdown Lifetime Simulator for Both Traditional CMOS and FinFET Technology

Yang, Kexin, Liu, Taizhi, Zhang, Rui, Milor, Linda

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Année:

2018

Langue:

english

Fichier:

PDF, 4.98 MB

english, 2018

24

[IEEE 2018 Conference on Design of Circuits and Integrated Systems (DCIS) - Lyon, France (2018.11.14-2018.11.16)] 2018 Conference on Design of Circuits and Integrated Systems (DCIS) - Estimation of the Optimal Accelerated Test Region for FinFET SRAMs Degraded by Front-End and Back-End Wearout Mechanisms

Zhang, Rui, Yang, Kexin, Liu, Taizhi, Milor, Linda

Année:

2018

Langue:

english

Fichier:

PDF, 1.60 MB

english, 2018

25

[IEEE 2018 International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2018.10.7-2018.10.11)] 2018 International Integrated Reliability Workshop (IIRW) - New Electromigration Model and Its Potential Application on Degradation Simulation for FinFET SRAM

Zhang, Rui, Yang, Kexin, Liu, Taizhi, Milor, Linda

Année:

2018

Fichier:

PDF, 177 KB

2018

26

Impact of front-end wearout mechanisms on FinFET SRAM soft error rate

Zhang, Rui, Liu, Zhaocheng, Yang, Kexin, Liu, Taizhi, Cai, Wenshan, Milor, Linda

Journal:

Microelectronics Reliability

Année:

2019

Langue:

english

Fichier:

PDF, 5.45 MB

english, 2019

27

A library based on deep neural networks for modeling the degradation of FinFET SRAM performance metrics due to aging

Zhang, Rui, Liu, Zhaocheng, Yang, Kexin, Liu, Taizhi, Cai, Wenshan, Milor, Linda

Journal:

Microelectronics Reliability

Année:

2019

Langue:

english

Fichier:

PDF, 6.77 MB

english, 2019

28

A real-time physiological signal acquisition and analyzing method based on fractional calculus and stream computing

Lv, Taizhi, Tong, Lian, Zhang, Jun, Chen, Yong

Journal:

Soft Computing - A Fusion of Foundations, Methodologies and Applications

Année:

2020

Fichier:

PDF, 1.24 MB

2020

29

[IEEE 2020 3rd International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE) - Shenzhen, China (2020.4.24-2020.4.26)] 2020 3rd International Conference on Advanced Electronic Materials, Computers and Software Engineering (AEMCSE) - Research on Diabetes Management Platform Based on Big Data Technology

Lv, Taizhi, Zhang, Juan, Chen, Yong

Année:

2020

Fichier:

PDF, 367 KB

2020

30

[IEEE 2019 5th International Conference on Control Science and Systems Engineering (ICCSSE) - Shanghai, China (2019.8.14-2019.8.16)] 2019 5th International Conference on Control Science and Systems Engineering (ICCSSE) - Parameters Identification of Air-Condition Compressor Driven by Motor Using the Least Squares Method

Zhang, Jiaran, Sun, Taizhi

Année:

2019

Fichier:

PDF, 453 KB

2019

31

The Research on Data Acquisition and Analysis Platform for Lathe Machine based on Stream Computing

Lv, Taizhi, Zhang, Juan, Chen, Yong

Journal:

Journal of Physics Conference Series

Année:

2020

Fichier:

PDF, 804 KB

2020